Self-Trapped Excitons discusses the structure and evolution of the self-trapped exciton (STE) in a wide range of materials. It includes a comprehensive review of experiments and extensive tables of data. Emphasis is given throughout to the unity of the basic physics underlying various manifestations of self-trapping, with the theory being developed from a localized, atomistic perspective. The topics treated in detail in relation to STE relaxation include spontaneous symmetry breaking, lattice defect formation, radiation damage, and electronic sputtering.
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语言 英语 ● 格式 PDF ● ISBN 9783642852367 ● 出版者 Springer Berlin Heidelberg ● 发布时间 2013 ● 下载 3 时 ● 货币 EUR ● ID 5782088 ● 复制保护 Adobe DRM
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