Recent advances in semiconductor technology offer vertical interconnect access (via) that extend through silicon, popularly known as through silicon via (TSV). This book provides a comprehensive review of the theory behind TSVs while covering most recent advancements in materials, models and designs. Furthermore, depending on the geometry and physical configurations, different electrical equivalent models for Cu, carbon nanotube (CNT) and graphene nanoribbon (GNR) based TSVs are presented. Based on the electrical equivalent models the performance comparison among the Cu, CNT and GNR based TSVs are also discussed.
قم بشراء هذا الكتاب الإلكتروني واحصل على كتاب آخر مجانًا!
لغة الإنجليزية ● شكل PDF ● صفحات 232 ● ISBN 9781498745536 ● الناشر CRC Press ● نشرت 2016 ● للتحميل 3 مرات ● دقة EUR ● هوية شخصية 5022149 ● حماية النسخ Adobe DRM
يتطلب قارئ الكتاب الاليكتروني قادرة DRM