مؤلف: Cristian Zambelli

Dr. Rino Micheloni is a Research Fellow at the University of Ferrara, Italy. Before that, he was Vice-President and Fellow at Microsemi/Microchip Corporation, where he established the Flash Signal Processing Labs in Milan, Italy, with special focus on NAND Flash technology characterization, machine learning techniques for improving memory reliability, and error correction codes. Prior to joining Microsemi, he was Fellow at PMC-Sierra, working on NAND Flash technology characterization, LDPC, and NAND Signal Processing as part of the team developing flash controllers for PCIe SSDs. Before that, he was with Integrated Device Technology (IDT) as Lead Flash Technologist, driving the architecture and design of the BCH engine in the world’s first PCIe NVMe SSD controller. Early in his career, he led NAND design teams at STMicroelectronics, Hynix, and Infineon; during this time, he developed the industry’s first MLC NOR device with embedded ECC technology and the industry’s first MLC NAND with embedded BCH. Dr. Micheloni is IEEE Senior Member, he has co-authored 100 publications in peer-reviewed journals and international conferences, and he holds 291 patents worldwide (including 139 US patents). He received the STMicroelectronics Exceptional Patent Award in 2003 and 2004, the Infineon IP Award in 2007, and he was elected to the PMC-Sierra Inventor Wall of Fame in 2013. In 2020, Dr. Micheloni was selected for the European Inventor Award. Dr. Micheloni has published the following books: 3D Flash Memories (Chinese edition by Tsinghua University Press, 2020), Inside Solid State Drives—2 nd edition— (Springer, 2018), Solid-State-Drives (SSDs) Modeling (Springer, 2017), 3D Flash Memories (Springer, 2016), Inside Solid State Drives (Springer, 2013), Inside NAND Flash Memories (Springer, 2010), Error Correction Codes for Non-Volatile Memories (Springer, 2008), Memories in Wireless Systems (Springer, 2008), VLSI-Design of Non-Volatile Memories (Springer, 2005), and Memorie in Sistemi Wireless (Franco Angeli, 2005). Dr. Cristian Zambelli received the M.Sc. and the Ph.D. degrees in Electronic Engineering from the University of Ferrara, Ferrara, Italy, in 2008 and 2012, respectively. Since 2015, he holds an Assistant Professor position with the same institution where he teaches data storage, electronic systems reliability, and FPGA laboratory. His current research interests include the electrical characterization, physics, and reliability modelling of different non-volatile memories such as NAND/NOR flash planar and 3D integrated, phase change memories, nano-MEMS memories, resistive RAM (RRAM), and magnetic RAM. He is also interested in the evaluation of the solid-state drives reliability/performance trade-offs exposed by the integrated memory technology and the implementation of computational storage paradigms by exploiting FPGAs and GPUs. Dr. Zambelli is an IEEE Member and authored or co-authored up to 107 publications in peer-reviewed journals, proceedings of international conferences, and book chapters. He serves in the TPC of several international conferences like IRPS, ESSDERC/ESSCIRC, and IIRW being for the latter also in the management committee. He is currently serving as Associate Editor for the IEEE Access journal since 2019.