A. S. Shirinyan & Andriy M. Gusak 
Diffusion-controlled Solid State Reactions [EPUB ebook] 
in Alloys, Thin-Films, and Nanosystems

Soporte

Written by an outstanding group of applied theoreticians with comprehensive expertise and a wide spectrum of international contacts headed by Prof. A. M. Gusak, this monograph coherently presents the approaches and results hitherto only available in various journal papers.
A must-have for all those involved with the public or corporate science of nano systems, thin films and electrical engineering.

€165.99
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Tabla de materias

1. Non-equilibrium Vacancies and Diffusion-controlled Processes at Nano-level (A. Gusak)
2. Diffusive Phase Competition: Fundamentals (A.Gusak)
3. Nucleation in a Concentration Gradient (A. Gusak)
4. Modeling of the Initial Stages of Reactive Diffusion (M. Pasichnyy, A. Gusak)
5. Flux-driven Morphology Evolution (A. Gusak)
6. Nano-void Evolution (T. Zaporozhets, A. Gusak)
7. Phase Formation via Electro-migration (S. Kornienko, A. Gusak)
8. Diffusive Phase Competition in Ternary Systems (S. Kornienko, Yu. Lyashenko, A. Gusak)
9. Interdiffusion with Formation and Growth of Two Phase Zones (Yu. Lyashenko, A. Gusak)
10. The Problem of Choice of Reaction Path and Extremal Principles (A. Gusak, Yu. Lyashenko)
11. Optimal Regimes in Cellular Decomposition (Yu. Lyashenko)
12. Nucleation and Phase Separation in Nano-volumes (A. Shirinyan, A. Gusak)

Sobre el autor

Having obtained his higher degrees at Moscow State University and Institute of Metallurgy of USSR’s Academy of Sciences, lead author Professor Gusak now is Deputy president of Cherkasy National University of Ukraine. Awarded with a prize by the American Physical Society for his work, he was investigator several international teams and served on international advisory boards for major conferences in this field. Visits have taken him to prestigious institutions, e.g. Univ. of Goettingen (Germany), UCLA (USA), Nanyang Technological University (Singapore).
The research of Professor Gusak and his co-workers focuses on modeling of electromigration, void migration and microstructure change in metals, metal junctions, and nano systems.

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Idioma Inglés ● Formato EPUB ● Páginas 476 ● ISBN 9783527641567 ● Tamaño de archivo 6.8 MB ● Editorial Wiley-VCH ● Publicado 2011 ● Edición 1 ● Descargable 24 meses ● Divisa EUR ● ID 2455480 ● Protección de copia Adobe DRM
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