Auteur: Yervant Zorian

Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (So Cs). Testing of microprocess …

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are ma …

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expan …

This book constitutes the refereed proceedings of the 21st International Conference on Collaboration and Technology, CRIWG 2015, held in Yerevan, Armenia, in September 2015.The 19 revised papers pres …