3 Ebooks par Zhang Nien Fan Zhang
Franco Pavese & Markus Baer: ADV MATH & COMP TOOL METROL VIII
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with appli …
PDF
Anglais
DRM
€289.99
Forbes Alistair B Forbes & Perruchet Christophe Perruchet: Advanced Mathematical And Computational Tools In Metrology And Testing Viii
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with appli …
PDF
Anglais
DRM
€84.16
F Pavese & A B Forbes: ADV MATH & COMP TOOL METROL XII
This volume contains original, refereed contributions by researchers from national metrology institutes, universities and laboratories across the world involved in metrology and testing. The volume h …
EPUB
Anglais
DRM
€139.99
