लेखक: Fangzhou Xia

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1 द्वारा ईबुक Fangzhou Xia

Ivo W. Rangelow & Fangzhou Xia: Active Probe Atomic Force Microscopy
From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of me …
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€101.34