* Software patterns have revolutionized the way developers think about how software is designed, built, and documented, and this unique book offers an in-depth look of what patterns are, what they are not, and how to use them successfully
* The only book to attempt to develop a comprehensive language that integrates patterns from key literature, it also serves as a reference manual for all pattern-oriented software architecture (POSA) patterns
* Addresses the question of what a pattern language is and compares various pattern paradigms
* Developers and programmers operating in an object-oriented environment will find this book to be an invaluable resource
विषयसूची
Foreword by Richard P. Gabriel.
Foreword by Wayne Cool.
About the Authors.
About this Book.
Guide to the Reader.
Beyond the Hype.
Beginnings’.
A Story of Success – with Some Exceptions.
Pattern Definitions and their Interpretations.
Toward a Deeper Understanding of Patterns.
PART I: INSIDE PATTERNS.
1. A solution to a Problem and More.
2. A Million Different Implementations.
3. Notes on Pattern Form.
PART II: BETWEEN PATTERNS.
4. Pattern Islands?
5. Pattern Complements.
6. Pattern Compounds.
7. Pattern Sequences.
8. Pattern Collections.
Part III Into Pattern Languages.
9. Elements of Language.
10. A Network of Patterns and More.
11. A Billion Different Implementations.
12. Notes on Pattern Language Form.
13. On Patterns versus Pattern Languages.
14. From Patterns To People.
15. The Past, Presence, And Future of Patterns.
16. All Good Things?
Afterword.
Pattern Concept Summary.
Referenced Patterns.
References.
Index of Patterns.
Index of Names.
Index.
लेखक के बारे में
Frank Buschmann is a Senior Principal Engineer for systems and software architecture at Siemens Corporate Technology in Munich. He focuses on digitalization strategies and technologies, the design and realization of industrial automation systems and research in software design and engineering technologies. He has served as serves as an editor of the Wiley Series in Software Design Patterns.
Kevlin Henney, Curbralan, Bristol, UK.
Douglas C. Schmidt, Vanderbilt University.
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