लेखक: Laung-Terng Wang

समर्थन

3 द्वारा ईबुक Laung-Terng Wang

Laung-Terng Wang & Xiaoqing Wen: VLSI Test Principles and Architectures
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up ti …
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अंग्रेज़ी
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€68.27
Charles E. Stroud & Nur A. Touba: System-on-Chip Test Architectures
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor ind …
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€64.49
Yao-Wen Chang & Kwang-Ting (Tim) Cheng: Electronic Design Automation
This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable ref …
EPUB
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€75.88