Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.
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भाषा अंग्रेज़ी ● स्वरूप PDF ● ISBN 9781461207115 ● प्रकाशक Springer New York ● प्रकाशित 2013 ● डाउनलोड करने योग्य 3 बार ● मुद्रा EUR ● आईडी 4720836 ● कॉपी सुरक्षा Adobe DRM
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