Laung-Terng Wang & Xiaoqing Wen 
VLSI Test Principles and Architectures [PDF ebook] 
Design for Testability

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. – Most up-to-date coverage of design for testability. – Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. – Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.