Tabella dei contenuti
Synergy Between Design and Technology: A Key Factor in the Evolving Microelectronic Landscape.- EMERGING TECHNOLOGY AND DEVICES.- New State Variable Opportunities Beyond CMOS: A System Perspective.- A Simple Compact Model to Analyze the Impact of Ballistic and Quasi-Ballistic Transport on Ring Oscillator Performance.- ADVANCED DEVICES AND CIRUITS.- Low-Voltage Scaled 6T Fin FET SRAM Cells.- Independent-Double-Gate FINFET SRAM Cell for Drastic Leakage Current Reduction.- Metal Gate Effects on a 32 nm Metal Gate Resistor.- RELIABILITY AND SEU.- Threshold Voltage Shift Instability Induced by Plasma Charging Damage in MOSFETS with High-K Dielectric.- Analysis of SI Substrate Damage Induced by Inductively Coupled Plasma Reactor with Various Superposed Bias Frequencies.- POWER, TIMING AND VARIABILITY.- CMOS SOI Technology for WPAN: Application to 60 GHZ LNA.- SRAM Memory Cell Leakage Reduction Design Techniques in 65 nm Low Power PD-SOI CMOS.- Resilient Circuits for Dynamic Variation Tolerance.- Process Variability-Induced Timing Failures – A Challenge in Nanometer CMOS Low-Power Design.- How Does Inverse Temperature Dependence Affect Timing Sign-Off.- CMOS Logic Gates Leakage Modeling Under Statistical Process Variations.- On-Chip Circuit Technique for Measuring Jitter and Skew with Picosecond Resolution.- ANALOG AND MIXED SIGNAL.- DC–DC Converter Technologies for On-Chip Distributed Power Supply Systems – 3D Stacking and Hybrid Operation.- Sampled Analog Signal Processing: From Software-Defined to Software Radio.
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