1 Ebook di Jean-remy Filtz
Franco Pavese & Markus Baer: Advanced Mathematical And Computational Tools In Metrology And Testing Ix
This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Göteborg (Sweden) in June 2011 on the theme of advance …
PDF
Inglese
DRM
€269.99
