Composed by a specialist in the field, Jian Liu, with contributions from a number of scientists and optical specialists, Elliptical Mirrors: Applications in microscopy discusses the importance of the elliptical mirror; the third solution in far-field optical imaging after parabolic reflectors and lenses for which apodization factors were established in 1921 and 1959 respectively. Elliptical mirrors are a new and novel technique within the world of optics and can be applied to industrial imaging, bioimaging X-ray photography and much more, and they will inevitably retain a significant role in the trend of microscopic development. This detailed and highly insightful book will be an important reference in a growing subject area that will benefit Ph D students, optical physicists, metrologists and researchers who have an interest in the ever-growing science of optics. The original content in this book will give a unique insight into mirror system design and applications in industrial metrology and bioimaging. It discusses the original theory of elliptical mirrors and gives a fundamental and comprehensive theory behind them and their functions.
Tabella dei contenuti
Table of Contents
Series preface
Preface
Acknowledgement
Author biography
List of contributors
Chapter 1 – Research and application of reflective microscopy
Chapter 2 – Apodization factor and linearly polarized light focusing properties of elliptical mirror
Chapter 3 – Focusing characteristic of polarized light
Chapter 4 – Imaging analysis of dipole vector in an elliptical mirror
Chapter 5 – Scalar approximation for the focusing property of an elliptical mirror
Chapter 6 – Aberration analysis of an elliptical mirror with a high numerical aperture
Chapter 7 – Three-dimensional transfer function
Chapter 8 – Design and application of an aspherical mirror
CHapter 9 – Elliptical mirror applied in TIRF microscopy
Circa l’autore
Jian Liu is a professor and the vice dean at the Harbin Institute of Technology, China. He is also an honorary professor at The University of Nottingham, UK. His academic interests lie in the theories and implementations of optical microscopes, and he has a particular interest in the development of optical microscopes, applied optics and optical metrology.
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