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Masashi Horiguchi & Kiyoo Itoh
Nanoscale Memory Repair [PDF ebook]

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perlindungan daripada Masashi Horiguchi & Kiyoo Itoh: Nanoscale Memory Repair (PDF)

Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.

€106.99

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An Introduction to Repair Techniques: Basics of Redundancy.- Basics of Error Checking and Correction.- Comparison between Redundancy and ECC.- Repairs of Logic Circuits.- Redundancy: Models of Fault Distribution.- Yield Improvement through Redundancy.- Replacement Schemes.- Intra-Subarray Replacement.- Inter-Subarray Replacement.- Subarray Replacement.- Devices for Storing Addresses.- Testing for Redundancy.- Error Checking and Correction: Linear Algebra and Linear Codes.- Galois Field.- Error-Correcting Codes.- Coding and Decoding Circuits.- Theoretical Reduction in Soft-Error and Hard-Error Rates.- Application of ECC.- Testing for ECC.- Synergistic Effect of Redundancy and ECC: Repair of Bit Faults using Synergistic Effect.- Application of Synergistic Effect.

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Bahasa Inggeris ● Format PDF ● Halaman-halaman 218 ● ISBN 9781441979582 ● Saiz fail 12.9 MB ● Penerbit Springer New York ● Bandar raya NY ● Negara US ● Diterbitkan 2011 ● Muat turun 24 bulan ● Mata wang EUR ● ID 2150544 ● Salin perlindungan Social DRM

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Masashi Horiguchi Kiyoo Itoh

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