Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations of the microscopic and electronicstructure, and also correlations with themagnetic propertiesof solids, require various multiplemagnetic resonance methods, such as ENDOR and opticallydetected EPR or ENDOR. This book discusses experimental, technological and theoretical aspects of these techniquescomprehensively, from a practical viewpoint, with manyillustrative examples taken from semiconductors and othersolids. The nonspecialist is informed about the potential ofthe different methods, while the researcher faced with thetask of determining defect structures isprovided with thenecessary tools, together with much information oncomputer-aided methods of data analysis and the principlesof modern spectrometer design.
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