Pengarang: Sudarshan Bahukudumbi

Sokongan

1 Ebooks by Sudarshan Bahukudumbi

Sudarshan Bahukudumbi: Wafer-Level Testing and Test During Burn-In for Integrated Circuits
Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias re …
PDF
Inggeris
DRM
€96.58