1 Ebooks by Sudarshan Bahukudumbi
Sudarshan Bahukudumbi: Wafer-Level Testing and Test During Burn-In for Integrated Circuits
Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias re …
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Inggeris
DRM
€96.58