Expert practical and theoretical coverage of runs and scans
This volume presents both theoretical and applied aspects of runs
and scans, and illustrates their important role in reliability
analysis through various applications from science and engineering.
Runs and Scans with Applications presents new and exciting content
in a systematic and cohesive way in a single comprehensive volume,
complete with relevant approximations and explanations of some
limit theorems.
The authors provide detailed discussions of both classical and
current problems, such as:
* Sooner and later waiting time
* Consecutive systems
* Start-up demonstration testing in life-testing experiments
* Learning and memory models
* ‘Match’ in genetic codes
Runs and Scans with Applications offers broad coverage of the
subject in the context of reliability and life-testing settings and
serves as an authoritative reference for students and professionals
alike.
Inhoudsopgave
List of Tables.
List of Figures.
Preface.
Introduction and Historical Remarks.
Waiting for the First Run Occurrence.
Applications.
Waiting for Multiple Run Occurrences.
Number of Run Occurrences.
Sooner/Later Run Occurrences.
Multivariate Run-Related Distributions.
Applications.
Waiting for the First Scan.
Waiting for Multiple Scans.
Number of Scan Occurrences.
Applications.
Bibliography.
Author Index.
Subject Index.
Over de auteur
N. BALAKRISHNAN, Ph D, is Professor of Mathematics and Statistics at
Mc Master University in Hamilton, Ontario, Canada. He is also the
author of A First Course in Order Statistics and four volumes of
the Distributions in Statistics series (all from Wiley).
MARKOS V. KOUTRAS, Ph D, is Professor of Statistics at the
University of Piraeus in Greece, where he researches applied
probability, reliability, and distribution theory.
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