This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals
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Formaat PDF ● Pagina’s 504 ● ISBN 9781482273380 ● Uitgeverij CRC Press ● Gepubliceerd 1995 ● Downloadbare 3 keer ● Valuta EUR ● ID 7124934 ● Kopieerbeveiliging Adobe DRM
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