Auteur: Ruijing Shen

Ondersteuning

1 Ebooks door Ruijing Shen

Ruijing Shen & Sheldon X.-D. Tan: Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of var …
PDF
Engels
€96.29