Auteur: Tibor Grasser

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit …

The ‘Twelfth International Conference on Simulation of Semiconductor Processes and Devices’ (SISPAD 2007) continues a long series of conferences and is held in September 2007 at the TU Wien, Vienna, …

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices.  Cover …

Microelectronics is one of the most rapidly changing scientific fields today. The tendency to shrink devices as far as possible results in extremely small devices which can no longer be described usi …

Dear Readers, Since the ground-breaking, Nobel-prize crowned work of Heeger, Mac Diarmid, and Shirakawa on molecularly doped polymers and polymers with an alternating bonding structure at the end of …

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices.  Readers will benefit from this leading-edge research, aimed at increasing reliability based on phy …