Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults, ’ but these test ...
Spis treści
Basics on SRAM Testing.- Resistive-Open Defects in Core-Cells.- Resistive-Open Defects in Pre-charge Circuits.- Resistive-Open Defects in Address Decoders.- Resistive-Op...
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Język Angielski ● Format PDF ● Strony 171 ● ISBN 9781441909381 ● Rozmiar pliku 5.7 MB ● Wydawca Springer US ● Miasto NY ● Kraj US ● Opublikowany 2009 ● Do pobrania 24 miesięcy ● Waluta EUR ● ID 2149846 ● Ochrona przed kopiowaniem Społeczny DRM