1 Ebooki wg Carlos H. Diaz
Carlos H. Diaz & Charvaka Duvvury: Modeling of Electrical Overstress in Integrated Circuits
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downwar …
PDF
Angielski
DRM
€165.53
