International trade in high value perishables has grown enormously
in the past few decades. In the developed world consumers now
expect to be able to eat perishable produce from all parts of the
world, and in most cases throughout the year. Perishable plant
products are, however, susceptible to physical damage and often
have a potential storage life of only a few days.
Given their key importance in the world economy, Crop
Post-Harvest Science and Technology: Perishables devotes itself
to perishable produce, providing current and comprehensive
knowledge on all the key factors affecting post-harvest quality of
fruits and vegetables. This volume focuses explicitly on the
effects and causes of deterioration, as well as the many techniques
and practices implemented to maintain quality though correct
handling and storage. As highlighted throughout, regular losses
caused by post-harvest spoilage of perishable products can be as
much as 50%. A complete understanding, as provided by this
excellent volume, is therefore vital in helping to reduce these
losses by a significant percentage.
Compiled by members of the world-renowned Natural Resources
Institute at the United Kingdom’s University of Greenwich, with
contributions from experts around the world, this volume is an
essential reference for all those working in the area. Researchers
and upper-level students in food science, food technology,
post-harvest science and technology, crop protection, applied
biology and plant and agricultural sciences will benefit from this
landmark publication. Libraries in all research establishments and
universities where these subjects are studied and taught should
ensure that they have several copies for their shelves.
Spis treści
Volume 3.
Perishables.
Fruit.
Vegetables.
Root and tuber crops.
Miscellaneous.
Glossary.
References.
Index.
O autorze
About the Editors
Debbie Rees and John Orchard are based at the Natural Resources Institute, University of Greenwich, U.K. Graham Farrell is a technical writer and editor specialising in plant health and analysis.