Jens Lienig & Matthias Thiele 
Fundamentals of Electromigration-Aware Integrated Circuit Design [PDF ebook] 

Wsparcie

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.

€90.94
Metody Płatności

Spis treści

Introduction.- Fundamentals of Electromigration.- Integrated Circuit Design and Electromigration.- Mitigating Electromigration in Physical Design.- Summary and Outlook.

O autorze


Jens Lienig is the director of the Institute of Electromechanical and Electronic Design at Dresden University of Technology, Germany. He received his Ph.D. in the field of computer-aided physical design of multi-chip modules and was employed as a researcher at University of Virginia, Charlottesville and Concordia University, Montreal. Afterwards he worked as project manager at Tanner Research, Inc. and Robert Bosch Gmb H. His main research subjects are design of electronic systems and electronic design automation. He is a member of IEEE.

Matthias Thiele is a scientific assistant at Dresden University of Technology, Germany. He received his Ph.D. in the field of electromigration. Currently he works on the reliability of electronic and mechatronic systems.

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Język Angielski ● Format PDF ● Strony 159 ● ISBN 9783319735580 ● Rozmiar pliku 5.9 MB ● Wydawca Springer International Publishing ● Miasto Cham ● Kraj CH ● Opublikowany 2018 ● Do pobrania 24 miesięcy ● Waluta EUR ● ID 5615143 ● Ochrona przed kopiowaniem Społeczny DRM

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