1 Ebooki wg Klaus-Rudiger Peters
John Armstrong & Patrick Echlin: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most impor …
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Angielski
DRM
€115.13
