2 Ebooki wg Nur Touba
Laung-Terng Wang & Xiaoqing Wen: VLSI Test Principles and Architectures
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up ti …
PDF
Angielski
DRM
€67.21
Charles E. Stroud & Nur A. Touba: System-on-Chip Test Architectures
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor ind …
PDF
Angielski
DRM
€64.49
