This book describes a circuit architecture for converting real analog signals into a digital format, suitable for digital signal processors. This architecture, referred to as multi-stage noise-shaping (MASH) Continuous-Time Sigma-Delta Modulators (CT-ΔΣM), has the potential to provide better digital data quality and achieve better data rate conversion with lower power consumption. The authors not only cover MASH continuous-time sigma delta modulator fundamentals, but also provide a literature review that will allow students, professors, and professionals to catch up on the latest developments in related technology.
Spis treści
Introduction.- Analog-To-Digital and Digital-To-Analog Converters.- Delta-Sigma Modulators.- Design Considerations Of Mash CT-ΔΣM.- A 43 m W MASH 2-2 CT ΔΣ Modulator Attaining 74.4/75.8/76.8 d B of SNDR/SNR/DR and 50 MHz of BW in 40nm CMOS.- A 50-MHz BW 67.3-d B SNDR MASH 1-1-1 CT ΔΣ Modulator with FIR DAC and Encoder-Embedded Loop-Unrolling Quantizer in 40-nm CMOS.- A 4-Bit Continuous-Time ΔΣ Modulator with Fully Digital Quantizer Noise Reduction Algorithm Employing a 7-bit Quantizer.- Conclusion.
O autorze
Qiyuan Liu is a Senior Engineer at Qualcomm.
Alexander Edward is a Senior Engineer at Intel.
Carlos Briseno-Vidrios is a Senior Engineer at Silicon Labs. Jose Silva-Martinez got his Ph D degree from the Katholieke Universiteit Leuven, Belgium in 1992. He currently holds the rank of Texas Instruments Professor in Analog Engineering at the Department of ECE, Texas A&M University. Dr. Silva-Martinez is an IEEE-Fellow and member of the 2013-2014 CASS Distinguish Lecture Program. His record of publications show over 100 journals and 160 conferences, 2 books and 12 book chapters and 1 patent. He is co-author of the papers that received the 2011 Best Student Paper Award, IEEE MWCAS, the 2003 Best Student Paper Award, IEEE RF-IC, and recipient of the 1990 Best Paper Award, European Solid-State Circuits Conference (ESSCIRC). He got the 2005 Outstanding Professor Award by the ECE Department, Texas A&M University, 2005; co-Advised in Testing techniques the student who was Winner ofthe 2005 Best Doctoral Thesis Award, presented by the IEEE Test Technology Technical Council (TTTC), IEEE Computer Society.
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