Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance, inelastic light scattering, magneto-optics, ultrafast work, piezo-spectroscopy methods, and spectroscopy at extremely low temperatures and high magnetic fields. Emphasis is given to major semiconductor systems, and artificially structured materials such as Ga As, In Sb, Hg1-x Cdx Te and MBE grown structures based upon Ga As/Al Ga As materials. Both the spectroscopic novice and the expert will benefit from the descriptions and discussions of the methods, principles, and applications relevant to today’s semiconductor structures.Key Features* Discusses the latest advances in spectroscopic techniques used to investigate bulk and artificially structured semiconductors* Features detailed review articles which cover basic principles* Highlights specific applications such as the use of laser spectroscopy for the characterization of Ga As quantum well structures
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