Manoj Sachdev has (co)authored several books for Springer/Kluwer
5 Ebooks por Manoj Sachdev
Arman Vassighi & Manoj Sachdev: Thermal and Power Management of Integrated Circuits
In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Th …
PDF
Inglês
€96.29
Manoj Sachdev & José Pineda de Gyvez: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional ap …
PDF
Inglês
€213.99
Oleg Semenov & Hossein Sarbishaei: ESD Protection Device and Circuit Design for Advanced CMOS Technologies
ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains. As the probl …
PDF
Inglês
€171.19
Andrei Pavlov & Manoj Sachdev: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physica …
PDF
Inglês
€160.49
Manoj Sachdev: Defect Oriented Testing for CMOS Analog and Digital Circuits
Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be …
PDF
Inglês
DRM
€92.72