Autor: Robert Duin

F. van der Heijden, Laboratory for Measurement andInstrumentation, Faculty of Electrical Engineering, University ofTwente, P.O. Box 217, 7500AE Enschede, The Netherlands His main research area is in Measurement and Instrumentation atan academic level and covers sensors and micro measurement systems, and image based measurement systems. He has written books, manybook chapters and journal articles. R.P.W. Duin, Pattern Recognition Group, Delft Universityof Technology, Department of Imaging Sciences & TechnologyLorentzeg 1-2628 CD Delft, The Netherlands His research includes: theory and applications of imageprocessing and pattern recognition, with a special interest insensors, measurements and measurement accuracy. He also studies thedevelopment and use of tools in this area. He has written 6 books(in English and Dutch) and many journal and conference papers andchapters in books. He is a member of Advanced School for Computingand Imaging (ASCI), Dutch Pattern Recognition Society (NVPHBV), International Association for Pattern Recognition (IAPR) and IAPRTechnical Committee TC1 (statistical pattern recognition). D. de Ridder, Pattern Recognition Group, Delft Universityof Technology, Department of Imaging Sciences & TechnologyLorentzeg 1-2628 CD Delft, The Netherlands He mainly works on methods for mapping high-dimensionalmeasurement sets to low-dimensional representations, suitable forsubsequent regression or classification. He works closely with RDuin and has co-written many papers with him. D.M.J. Tax, Fraunhofer FIRST.IDA, Kekul´estr. 7, D-12489, Berlin, Germany His main research interest is one-class classification. He wasthe author/co-author of many journal publications