Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons
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Formato EPUB ● Páginas 384 ● ISBN 9781135499259 ● Editor Wai-Kai (University of IIlinois, Chicago, USA) Chen ● Editora CRC Press ● Publicado 2003 ● Carregável 3 vezes ● Moeda EUR ● ID 7107964 ● Proteção contra cópia Adobe DRM
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