Coulomb Interactions in Particle Beams, Volume 223 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods used in all these domains, with this release exploring Coulomb Interactions in Particle Beams. – Provides the authority and expertise of leading contributors from an international board of authors- Presents the latest release in the Advances in Imaging and Electron Physics series- Updated release includes the latest information on Coulomb Interactions in Particle Beams
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