автор: Moises Padilla

Manuel Servin received his engineering diploma from the Ecole Nationale Superieure des Telecommunications in France (1982), and his Ph.D. from the Centro de Investigaciones en Optica A. C. (CIO) at Leon Mexico in 1994. He is co-author of the book `Interferogram Analysis for Optical Testing?. Dr. Servin has published more than 100 papers in scientific peer-reviewed journals on Digital Interferometry and Fringe Analysis. Juan Antonio Quiroga received his Ph.D. in physics in 1994 from the Universidad Complutense de Madrid, Spain. He is now teaching there at the Physics Faculty. His current principal areas of interest are Digital image processing applied to Optical Metrology and applied optics Moises Padilla is a Ph.D. student in optical sciences at the Centro de Investigaciones en Optica (CIO) at Leon Mexico. He is associated with the optical metrology division of the CIO. His research activities are in digital signal processing and electrical communication engineering applied to processing and analysis of optical interferogram images.