A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale
* Highlights the advanced research work from industry and academia in micro-nano devices test technology
* Written at both introductory and advanced levels, provides the fundamentals and theories
* Focuses on the measurement techniques for characterizing MEMS/NEMS devices
Об авторе
WENDONG ZHANG, North University of China, China
XIUJIAN CHOU, North University of China, China
TIELIN SHI, Huazhong University of Science and Technology, China
ZONGMIN MA, North University of China, China
HAIFEI BAO, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, China
JING CHEN, Peking University, China
LIGUO CHEN, Soochow University, China
DACHAO LI, Tianjin University, China
CHENYANG XUE, Key Laboratory of Instrument Science and Dynamic Measurement, Ministry of Education, China
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