This up-to-date reference for students and researchers in the field is the first systematic treatment on the property measurements of organic semiconductor materials. Following an introduction, the book goes on to treat the structural analysis of thin films and spectroscopy of electronic states. Subsequent sections deal with optical spectroscopy and charge transport.
An invaluable source for understanding, handling and applying this key type of material for physicists, materials scientists, graduate students, and analytical laboratories.
Table of Content
1. Introduction
2. Growth of Thin Films
3. Structural Analysis
4. Optical spectroscopy
5. Electronic and Chemical Surface Properties
6. Charge Transport
About the author
Thorsten Kampen is product manager for electron spectroscopy at the SPECS Surface Nano Analysis Gmb H and lecturer at the Department of Solid State Physics of the Technical University Berlin, Germany. After having obtained his Ph.D. from the University of Duisburg, he moved on to work at the Technical University of Chemnitz and then in the Molecular Physics Group of the Fritz-Haber-Institute of the Max-Planck-Society in Berlin. His assignments included research stays in the US and Japan. On the national level, Dr. Kampen was involved in projects of the Deutsche Forschungsgemeinschaft DFG.
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