This ninth volume in the series concentrates on in situ spectroscopic methods and combines a balanced mixture of theory and applications, making it highly readable for chemists and physicists, as well as for materials scientists and engineers. As with the previous volumes, all the chapters continue the high standards of this series, containing numerous references to further reading and the original literature, for easy access to this new field. The editors have succeeded in selecting highly topical areas of research and in presenting authors who are leaders in their fields, covering such diverse topics as diffraction studies of the electrode-solution interface, thin organic films at electrode surfaces, linear and non-linear spectroscopy as well as sum frequency generation studies of the electrified solid-solution interface, plus quantitative SNIFTIRS and PM-IRRAS. Special attention is paid to recent advances and developments, which are critically and thoroughly discussed.
The result is a compelling set of reviews, serving equally well as an excellent and up-to-date source of information for experienced researchers in the field, as well as as an introduction for newcomers.
Зміст
In Situ X-ray Diffraction Studies of the Electrode-solution Interface
UV-visible Reflectance Spectroscopy of Thin Organic Films at Electrode Surfaces
Epi-fluorescence Microscopy Studies of Potential Controlled Changes in Adsorbed Thin Films at Electrode Surfaces
Linear and Non-linear Spectroscopy at the Electrified Liquid-liquid Interface
Sum Frequency Generation Studies of the Electrified Solid-solution Interface
IR Spectroscopy of the Semiconductor-solution Interface
Recent Advances in the In Situ IR Spectroscopy Studies of Electroanalysis at Pt Electrode Surfaces
In-situ Surface Enhanced IR Spectroscopy of the Electrode-solution Interface
Quantitative SNIFTIRS and PM-IRRAS of Organic Molecules at Electrode Surfaces
Tip-enhanced Raman Spectroscopy Recent Developments and Future Prospects
Про автора
Richard C. Alkire, Department of Chemical Engineering, University of Illinois, Urbana, USA
Dieter M. Kolb, Department of Electrochemistry, University of Ulm, Germany
Jacek Lipkowski, Department of Chemistry, University of Guelph, Canada
Philip N. Ross, Materials Science Department, Lawrence Berkeley National Laboratory, Berkeley, USA
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