Nanocharacterisation provides an overview of the main characterisation techniques that are currently used to study nanostructured materials. Following on from the success of the first edition, this new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods. With contributions from internationally recognised experts, each chapter focuses on a different technique to characterise nanomaterials providing experimental procedures and applications. State of the art characterisation methods covered include Transmission Electron Microscopy, Scanning Transmission Electron Microscopy, Scanning Probe Microscopy, Electron Energy Loss Spectroscopy and Energy Dispersive X-ray Analysis, 3D Characterisation, Scanning Electron and Ion Microscopy and In situ Microscopy. Essentially a handbook to all working in the field this indispensable resource will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology.
Mục lục
Characterization of Nanomaterials using Transmission Electron Microscopy; Characterization of Nanomaterials using Scanning Transmission Electron Microscopy; Scanning Probe Microscopy of Nanostructures; Electron Energy Loss Spectroscopy and Energy Dispersive X-ray Analysis in Nanostructure Characterisation; Measurements of Fields in Nanostructures; 3D Characterisation of Nanostructures; Scanning Electron and Ion Microscopy at the Nanoscale; In situ Microscopy of Nanomaterials;
Giới thiệu về tác giả
A I Kirkland is Professor of Materials at Oxford University and the author of over 170 refereed papers. He was awarded ‘best materials paper’ of 2005 by the Microscopy Society of America. Since 2000 he has also been involved in the characterisation of CCD cameras for TEM. His most recent work involves the development of approaches to complex phase extension and diffractive imaging to further improve resolution.
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