Tác giả: Angus Kirkland

Ủng hộ
A I Kirkland is Professor of Materials at Oxford University and the author of over 170 refereed papers. He was awarded “best materials paper” of 2005 by the Microscopy Society of America. Since 2000 he has also been involved in the characterisation of CCD cameras for TEM. His most recent work involves the development of approaches to complex phase extension and diffractive imaging to further improve resolution. J l Hutchinson is a Reader in Materials at Oxford University and has published over 300 refereed papers during his career.. He is currently Vice-President of the Royal Microscopical Society (President 2002-2004), and from 2000-2004 was also a member of the Executive Board of the European Microscopy Society. He has also been involved in the development of the world”s first double-aberration-corrected electron microscope.




2 Ebooks bởi Angus Kirkland

John Hutchison & Angus Kirkland: Nanocharacterisation
Chemical characterisation techniques have been essential tools in underpinning the explosion in nanotechnology in recent years and nanocharacterisation is a rapidly developing field. Contributions in …
PDF
Anh
DRM
€104.99
Peter W. Hawkes & Erwin Kasper: Principles of Electron Optics, Volume 2
Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magne …
EPUB
Anh
DRM
€236.47