This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.
表中的内容
Introduction.- Cache Architecture and Main Blocks.- Embedded Memory Hierarchy.- SRAM Memory Operation and Yield.- Low Power and High Yield SRAM Memory.- Leakage Reduction.- Embedded Memory Verification.- Embedded Memory Design Validation and Design For Test.- Emerging Memory Technology Opportunities and Challenges.购买此电子书可免费获赠一本!
语言 英语 ● 格式 PDF ● 网页 95 ● ISBN 9781461488811 ● 文件大小 3.8 MB ● 出版者 Springer New York ● 市 NY ● 国家 US ● 发布时间 2013 ● 下载 24 个月 ● 货币 EUR ● ID 2831457 ● 复制保护 社会DRM