2 电子书 Caparica D Richter
Patrizia Ciarlini & Franco Pavese: ADV MATH & COMP TOOL METROL IV
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In …
PDF
英语
DRM
€219.99
Patrizia Ciarlini & Maurice G Cox: ADV MATH & COMP TOOL METROL V
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. …
PDF
英语
DRM
€289.99
