作者: Filtz Jean-remy Filtz

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1 电子书 Filtz Jean-remy Filtz

Forbes Alistair B Forbes & Pavese Franco Pavese: Advanced Mathematical And Computational Tools In Metrology And Testing Ix
This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Goteborg (Sweden) in June 2011 on the theme of advanced …
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