关于作者
Prof. Dr.-Ing. habil. Gerald Gerlach:1983, 1987 Diploma and doctoral degree in EE from Technische Universität Dresden, Germany, respectively R&D engineer in measuring devic...
关于作者
Prof. Dr.-Ing. habil. Gerald Gerlach:1983, 1987 Diploma and doctoral degree in EE from Technische Universität Dresden, Germany, respectively R&D engineer in measuring devices industry. Since 1993 Professor for Microtechnology, since 1996 Professor for Solid State Electronics in EE department of TU Dresden. 2001/02 Visiting professor at UCLA. Since 2002 Member of the Executive of VDE (German Association of Engineers in Electrical Engineering, Electronics, Information Technology). Since 2007 Chairperson of the German Society for Measurement and Automatic Control (GMA). Since 1996 Conference Chairman of the biannually organised International Conference „Infrared Sensors and Systems IRS2′ in Nuremberg (in conjunction with the world’s largest sensor exhibition ‘Sensor+Test’). 2008 General Chairman of the Eurosensors XXII Conference, Dresden. Author and Co-author of some 280 scientific journal and international conference papers, holds more than 40 patents.
Prof. Dr.-Ing. habil. Klaus-Juergen Wolter: 1967-1973 Studies in Control Theory at the Technical University Kiev, Ukraine. 1983 Dissertation ‘Correlation method for vision systems in microelectronics assembly’. 1987 University Teaching Qualification (Habilitation). 1989-1973 R&D position the microelectronics industry. 1989 Assistant professor at the Institute of Electronic Technology. 1992 Appointment as Chair of Procedure Technology of Electronics. 1998 – 1999 Sabbatical at Tessera, San Jose, CA, (Wafer-Level-Packaging). Since 2002 Director of the Centre of Microtechnical Manufacturing (ZµP) at TUD. Since 2003 Director of the Electronic Packaging Lab at Dresden University of Technology. Since 2006 Deputy Head at Fraunhofer Institute IZFP Dresden.Fields of research: Substrate technologies, Assembly technologies of devices, components, MEMS, Joining technologies, Reliability of electronic packages, Non-destructive test methods
