作者: Haifei Bao

支持
WENDONG ZHANG, North University of China, China XIUJIAN CHOU, North University of China, China TIELIN SHI, Huazhong University of Science and Technology, China ZONGMIN MA, North University of China, China HAIFEI BAO, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, China JING CHEN, Peking University, China LIGUO CHEN, Soochow University, China DACHAO LI, Tianjin University, China CHENYANG XUE, Key Laboratory of Instrument Science and Dynamic Measurement, Ministry of Education, China




2 电子书 Haifei Bao

Wendong Zhang & Xiujian Chou: Measurement Technology for Micro-Nanometer Devices
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale * Highlights the advanced research work from industry and academia in micro-nano devices test tec …
PDF
英语
DRM
€128.99
Wendong Zhang & Xiujian Chou: Measurement Technology for Micro-Nanometer Devices
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale * Highlights the advanced research work from industry and academia in micro-nano devices test tec …
EPUB
英语
DRM
€128.99