Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
表中的内容
Background and Prior Art.- Current Landscape in Design and Verification.- Finding Bugs and Repairing Circuits.- Fog Clear Methodologies and Theoretical Advances in Error Repair.- Circuit Design and Verification Methodologies.- Counterexample-Guided Error-Repair Framework.- Signature-Based Resynthesis Techniques.- Symmetry-Based Rewiring.- Fog Clear Components.- Bug Trace Minimization.- Functional Error Diagnosis and Correction.- Incremental Verification for Physical Synthesis.- Post-Silicon Debugging and Layout Repair.- Methodologies for Spare-Cell Insertion.- Conclusions.关于作者
Winner of the EDAA (European Design Automation Association) Outstanding Monograph Award in the Verification section. Co-authors Bertacco and Markov are existing Springer authors来自同一作者的更多电子书 / 编辑
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