Materials metrology, a burgeoning branch of the field, is a subject of intense scrutiny by both researchers and stakeholders. The focal points of their attention are twofold: understanding the objectives of material metrology research and determining effective methods for utilizing its findings. Researchers and stakeholders delve into the intricacies of ensuring traceability of complex units from equipment and maintaining consistency in measurement results across various methods. The application of materials metrology extends to calibrating equipment and/or measurement methods, as well as utilizing critical data for production assessments.
Graphene’s emergence sparked widespread interest across various fields. The rapid progress of graphene and related two-dimensional materials in both research and industrial applications necessitates robust support from metrology, standards, and conformity assessment, collectively known as national quality infrastructures (NQI). This book, using graphene and related two-dimensional materials as exemplars, explores fundamental concepts and terminologies of metrology and materials metrology, elucidates the technological framework of metrology and standards, and elaborates on various metrological techniques for the structural characterization of graphene and related materials, including Raman spectroscopy, X-ray diffraction, atomic force microscopy, and electron microscopy. Additionally, the book presents techniques for quality evaluation, such as X-ray photoelectron spectroscopy, inductively coupled plasma mass spectrometry, and Fourier transform infrared spectrometry. By leveraging established standard measurement instruments, reference materials, measurement methods, and interlaboratory comparisons, this book endeavors to attain accurate and consistent measurement results.
Globally equivalent results can guarantee the quality of graphene products, fostering standardization, mass production, and sustainable advancement within the graphene industry.
Contents:
- Metrology and Materials Metrology (Lingling Ren)
- National Quality Infrastructure and Metrology (Measurement) of Graphene and Related 2D Materials (Lingling Ren)
- Metrological Technology of Raman Spectroscopy for Graphene-Related Materials (Yaxuan Yao)
- Measurement of the Crystal Structure of Graphene-Related Materials by X-ray Diffraction (Huifang Gao)
- Measurement of Thickness of Graphene-Related Materials by Atomic Force Microscopy (AFM) (Tianjia Bu)
- Metrological Technology of Electron Microscope for Graphene-Related Materials (Xu Li, Guocai Dong, Xiaomin Zhang, and Jinlong Li)
- Measurement of Chemical Composition of Graphene Powder by XPS and ICP-MS (Renxiao Liu, Guanglu Ge, Peng Xu, and Guolan Tian)
Readership: Researchers in metrology for graphene-related materials: in universities and colleges, metrology institutes, testing organizations, as well as inspectors and testers in industry.
Key Features:
- Useful as reference material to efficiently design and produce advanced materials
- Helpful for stakeholders intending to plan their own roadmap of advanced material metrology
- Elaborates on the topics necessary for readers to develop reference materials and standard measurement methods using similar ideas, but also may provide guidance for readers to ensure the continued quality of graphene products
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