Pierre-Richard Dahoo & Philippe Pougnet 
Nanometer-scale Defect Detection Using Polarized Light [PDF ebook] 

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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbo...

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表中的内容

Chapter 1 Multivariate Statistical Principal Component Analysis (PCA)
Chapter 2 Reliability Optimization of Systems
Chapter 3 Wave-Particle Nature of Light
Chapter 4 Polari...

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关于作者

Pierre Richard Dahoo is Professor at the University of Versailles Saint-Quentin in France. His research interests include absorption spectroscopy, laser-induced fluorescence, e...

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语言 英语 ● 格式 PDF ● 网页 316 ● ISBN 9781119329657 ● 文件大小 10.7 MB ● 出版者 John Wiley & Sons ● 发布时间 2016 ● 版 1 ● 下载 24 个月 ● 货币 EUR ● ID 4957339 ● 复制保护 Adobe DRM
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