In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.
表中的内容
Preliminaries.- Boolean Satisfiability.- SAT-Based ATPG.- Learning Techniques.- Multiple-Valued Logic.- Improved Circuit-to-CNF Conversion.- Branching Strategies.- Integration into Industrial Flow.- Delay Faults.- Summary and Outlook.
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