P. Krishna & M. T. Sebastian 
Random Non-Random Periodic Fau [EPUB ebook] 

This book provides a comprehensive overview of stacking faults in crystal structures. Subjects covered include: notations used in representations of close-packed structures; types of faults; methods of detection and measurement such as X-ray diffraction, electron diffraction and other techniques; theoretical models of non-random faulting during phase transitions; specific examples of – close packed structures including, zinc sulphide, silicon carbide and silver iodide.