This book provides a comprehensive overview of stacking faults in crystal structures. Subjects covered include: notations used in representations of close-packed structures; types of faults; methods of detection and measurement such as X-ray diffraction, electron diffraction and other techniques; theoretical models of non-random faulting during phase transitions; specific examples of – close packed structures including, zinc sulphide, silicon carbide and silver iodide.
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Língua Inglês ● Formato EPUB ● Páginas 400 ● ISBN 9781351552363 ● Editora CRC Press ● Publicado 2017 ● Carregável 3 vezes ● Moeda EUR ● ID 5325487 ● Proteção contra cópia Adobe DRM
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